About this scholarly article

2014 IEEE Conference on Computer Vision and Pattern Recognition - Rich Feature Hierarchies for Accurate Object Detection and Semantic Segmentation by Girshick, Ross; Donahue, Jeff; Darrell, Trevor; Malik, Jitendra is a scholarly article available to read on EtoBox.

Author

Girshick, Ross; Donahue, Jeff; Darrell, Trevor; Malik, Jitendra

Publisher

IEEE

Published

2014

Language

EN